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Spectroscopic characterization and detection of yield-killing defects in micro-LED wafers

Emerging display technologies demand high brightness, low power consumption and longer lifetime. Arrays, of self-emitting, micron-sized LEDs or Micro-LED (?LED), are considered a strong contender to replace current OLED or LCD displays. The estimated growth of the micro-LED (?LED) market is USD 21 billion by 2028. Increasing demand for brighter & more power-efficient displays in automotive panels, smartwatches, mobile devices are some of the factors driving the growth of the segment.

Despite the huge potential, ?LED technology is not yet fully commercialized. This is mainly due to the cost and challenges involved in the production process. For example, wearable devices, such as smart watches or augmented reality (AR) glasses, demand high resolution or high pixel density. To achieve high pixel density, the size of the ?LEDs should go down to 3 ?m or lower. At this length scale transferring the dies to the wafer and improving the yield is challenging, Low yields can drastically increase production costs.

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