From blank wafer to final device, 蓝鲸体育直播鈥檚 analytical instrument for material characterization are used by leading end-user and research organization for more than 50 years. Designed to achieve ultimate performances, they are the right tools to accelerate the time to market and yield improvement in any processes involving thin film and advanced material deposition.
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Roughness | 鈼� | 鈼� | 鈼� | |||||||
Film thickness | 鈼� | |||||||||
Optical properties (n, k) | 鈼� | |||||||||
Band Gap | 鈼� | 鈼� | 鈼� | |||||||
Crystallinity | 鈼� | 鈼� | ||||||||
Stochiometry | 鈼� | 鈼� | 鈼� | |||||||
Chemical composition | 鈼� | |||||||||
Elemental composition | 鈼� | 鈼� | 鈼� | |||||||
Defects | 鈼� | 鈼� | 鈼� | |||||||
Impurities | 鈼� | |||||||||
Stress measurement | 鈼� | |||||||||
Doping concentration | 鈼� | |||||||||
Particle sizing | 鈼� |
校 胁邪褋 械褋褌褜 胁芯锌褉芯褋褘 懈谢懈 锌芯卸械谢邪薪懈褟? 袠褋锌芯谢褜蟹褍泄褌械 褝褌褍 褎芯褉屑褍, 褔褌芯斜褘 褋胁褟蟹邪褌褜褋褟 褋 薪邪褕懈屑懈 褋锌械褑懈邪谢懈褋褌邪屑懈.
